Failure Patterns: a powerful way to optimize your testing

Hatton, L. (2007) Failure Patterns: a powerful way to optimize your testing. In: StarEast 2007; 14-18 May 2007, Orlando, Florida.

Item Type:	Conference or Workshop Item (Lecture)
Event Title:	StarEast 2007
Research Area:	Research Areas > Computer science and informatics
Faculty, School or Research Centre:	Faculty of Computing, Information Systems and Mathematics (until 2011)
Date Deposited:	14 Mar 2014 14:58
Last Modified:	06 Oct 2020 13:57
URI:	https://eprints.kingston.ac.uk/id/eprint/17020

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