Correlation between failure mechanism and rupture lifetime of 2D-C/SiC under stress oxidation condition based on acoustic emission pattern recognition

Lyu, Peng, Yao, Leijiang, Ma, Xiaofei, An, Gang, Bai, Guodong, Augousti, Andy T. and Tong, Xiaoyan (2020) Correlation between failure mechanism and rupture lifetime of 2D-C/SiC under stress oxidation condition based on acoustic emission pattern recognition. Journal of the European Ceramic Society, ISSN (print) 0955-2219 (Epub Ahead of Print)

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